Upcoming Webinars
- August 13, 2008
Counting, Sorting and Categorizing Objects in Images - August 26, 2008
Live Cell Fluorescence Imaging - September 3, 2008
Performing FRAP Studies with a Widefield Microscope - September 4, 2008
Ratiometric Image Analysis - September 12, 2008
Image Stitching of Large Specimens Using Automated Stages - September 23, 2008
Tracking Objects in 2D and 3D - September 23, 2008
Improved Stereoscopy Using Extended Depth-of-Field Processing - September 25, 2008
Introduction to Image Processing - September 30, 2008
Simultaneous IR-DIC and Fluorescence Imaging
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Sieve Calibration and Particle Characterization Using Digital Image Analysis
Presenter Name: Marc Landman, President of Vision Machines Inc.
June 4, 2008
Wednesday at
10:00 AM (New York time)
 Pre-register for this Webinar
Proper sieve calibration and accurate geometric measurements are essential requirements for anyone working with particles. Two common methods for particle characterization are sieving and image analysis. While image analysis is the preferred solution for particle shape information, sieving remains an excellent, low-cost tool for particle sizing. To ensure such accuracy, sieves must be regularly calibrated to a traceable standard such as NIST.
Attendees will learn about a cost-effective instrument that can perform both sieve calibration and particle characterization using state-of-the-art optics and digital image analysis. For sieves, hundreds of openings and wire diameters can be scanned and measured in a matter of seconds. For particles, size distributions and shape information such as area, roundness, aspect ratio, and mean diameter can be quickly generated.
Bring your questions to this live, interactive web-based seminar.
Subjects include:
- Overview and limitations of current sieve calibration and particle analysis methods
- Benefits of an integrated sieve calibration and particle analysis instrument
- Camera, optics, and lighting for capturing high-quality images of sieves and particles
- Simplified "wizard" interface for certifying sieves and measuring particles
- Archiving measurement data and images
- Live software demo
- Question and answer session
Provided at no cost, this webinar is sponsored by MAG, the Microimaging Applications Group. MAG is a group of imaging companies who work together to provide an unparalleled range of microimaging solutions to science and industry.
About the Presenter:
Marc Landman is the President of Vision Machines Inc., a firm specializing in product development and integration of machine vision and image analysis technologies. Mr. Landman has over 25 years experience implementing machine vision and image processing systems, and is the principal developer of the Automated Sieve and Particle Analysis system. Educated at the State University of New York and Boston University, Mr. Landman has performed cutting-edge work in the areas of 3-D vision, color image recognition, and particle analysis.
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